Size calibration
Select a certified mean that supports an instrument response curve or size-setting check.
20 nm–160 µmCore aqueous PSL families span nanometer through large-micrometer nodes.
Application separatedSize calibration, count controls, filter challenge and wafer work are not treated as interchangeable.
Traceability disciplinedClaims are tied to measurement results, certificates, uncertainty and a documented chain.
Manufacturer pathwayTechnical guidance connects directly to current Applied Physics families and support.
Decision framework
Diameter matters. Intended use matters more.
Two bottles can contain particles of a similar nominal diameter and still be wrong substitutes for one another. Concentration, distribution, medium, certificate scope, fill volume and delivery method determine whether the material fits the measurement.
Count verification
Use a defined particle number concentration and sampling plan when the objective is count repeatability.
Filter challenge
Use material designed for aerosol challenge and test-method compatibility—not automatically a calibration-grade suspension.
Wafer metrology
Separate suspended PSL used for deposition from the finished particle wafer standard used on the SSIS.
Selection map
Start with the response you need to control.
Instrument response
What will the instrument report: optical-equivalent size, count, concentration, efficiency, detection threshold or deposited response?
Measurement medium
Air, water, process liquid, aqueous bottle, aerosol or wafer surface each changes the relevant handling and response.
Evidence package
The certificate must support the exact value the procedure depends upon, including uncertainty and lot identity.
Product families
Applied Physics pathways—kept intentionally distinct.
| Family | Typical role | Current published range / format | Do not assume |
|---|---|---|---|
| 3000-series aqueous PSL | Submicron size standards | 20–900 nm; current family pages describe 15 mL, 1% aqueous suspension | Every nominal diameter is available in every bottle volume or certificate format |
| 4000-series aqueous PSL | Micron and larger size standards | Approximately 1–160 µm; current family page describes 15 mL aqueous suspension | A large-particle method has the same sampling or dispersion behavior as a submicron method |
| SURF-CAL | Selected high-concentration SSIS/deposition nodes | 50 mL; selected sizes and concentration options | SURF-CAL is itself a finished wafer artifact |
| Ezy-Cal / count controls | Liquid particle-counter count checks | Ready-to-use count concentration at selected sizes | A count control replaces a full size-calibration standard |
| HEPA Test PSL | Filter challenge and aerosol work | Current AP pages describe 30 nm–3.1 µm, 10% solids and multiple volumes | Challenge-grade particles are intended for instrument calibration |
Authority system
Built for search, buyers and machine-readable technical discovery.
This site is structured around discrete questions that engineers, quality teams and procurement specialists actually ask. Each page states its scope, limits, controlling evidence and relationship to Applied Physics products.
Entity clarity
Applied Physics Corporation is openly identified as publisher and manufacturer; ownership is not concealed.
Extractable answers
Definitions, decision rules, tables and FAQs are written so both humans and AI systems can interpret them accurately.
Original tools
The selector, dilution calculator, conversion chart and requirement brief turn passive traffic into measurable technical intent.
Applied Physics technical pathway
Build the requirement before requesting a quote.
Use the tools to define the application, then let Applied Physics confirm the correct family, size node, concentration and documentation.