PSLSpheres.com
Owns suspended PSL selection, particle properties, concentration and metrology concepts.
Select the suspension for the deposition method, then treat the finished wafer standard and the SSIS response as separate controlled stages.
| Pathway | When it fits | Controlling questions |
|---|---|---|
| Standard aqueous PSL | Custom or general deposition workflow | Size node, concentration, dilution, deposition-system compatibility |
| SURF-CAL | Selected pre-mixed high-concentration SSIS/deposition nodes | Instrument/deposition model, concentration option, selected sizes |
| Finished calibration wafer | Customer needs a characterized wafer artifact | Wafer diameter, substrate, deposition pattern, counts, nodes, tool model |
Owns suspended PSL selection, particle properties, concentration and metrology concepts.
Owns the finished wafer artifact, deposition patterns, handling and SSIS compatibility.
Owns the commercial product, quote, manufacturing capability and current specifications.
Send the instrument, medium, target size, concentration, certificate and packaging requirements to Applied Physics for a technical recommendation.