PSL Spheres Technical Resource is published by Applied Physics Corporation — precision technologies since 1992.719-428-4042 · [email protected]
Semiconductor metrology

PSL spheres support the wafer-metrology chain.

Select the suspension for the deposition method, then treat the finished wafer standard and the SSIS response as separate controlled stages.

Workflow

Suspended PSL is an input; the wafer standard is the artifact

  1. Select the particle size node and concentration appropriate to the deposition system.
  2. Prepare or use a qualified PSL suspension under the deposition method.
  3. Deposit particles onto a defined wafer surface and pattern.
  4. Characterize the deposited standard and establish the controlling values.
  5. Scan the wafer on the SSIS and compare instrument response with the reference.
Critical distinction: a bottle of PSL spheres is not the same product as a finished particle wafer standard.
Product pathways

Standard PSL, SURF-CAL and finished wafers

PathwayWhen it fitsControlling questions
Standard aqueous PSLCustom or general deposition workflowSize node, concentration, dilution, deposition-system compatibility
SURF-CALSelected pre-mixed high-concentration SSIS/deposition nodesInstrument/deposition model, concentration option, selected sizes
Finished calibration waferCustomer needs a characterized wafer artifactWafer diameter, substrate, deposition pattern, counts, nodes, tool model
SSIS compatibility

The scanner defines more than the particle size

  • SSIS manufacturer and model.
  • Laser wavelength and detection configuration.
  • Wafer diameter and surface type.
  • Detection threshold and calibration range.
  • Spot, full-deposition or other pattern.
  • Target count and spatial distribution.
  • Reference and certificate requirements.
Cross-property strategy

Use the right authority site

PSLSpheres.com

Owns suspended PSL selection, particle properties, concentration and metrology concepts.

ParticleWaferStandards.com

Owns the finished wafer artifact, deposition patterns, handling and SSIS compatibility.

AppliedPhysicsUSA.com

Owns the commercial product, quote, manufacturing capability and current specifications.

Open ParticleWaferStandards.com

Applied Physics technical pathway

Match the standard to the measurement—not the other way around.

Send the instrument, medium, target size, concentration, certificate and packaging requirements to Applied Physics for a technical recommendation.