SURF-CAL suspension
Customer operates a compatible deposition method and needs selected PSL concentration/size nodes.
Intended role
Pre-mixed PSL for selected SSIS deposition workflows
Current Applied Physics SURF-CAL content describes selected PSL size nodes in a 50 mL bottle, prepared at high concentration for scanning surface inspection system calibration and monitoring workflows.
Product boundary: SURF-CAL is a suspension input for deposition or SSIS work. It is not itself a finished particle wafer standard.
Current profile
Family-level attributes
| Attribute | Current Applied Physics description |
|---|---|
| Bottle volume | 50 mL |
| Medium | Filtered deionized water |
| Concentration pathways | Selected high-concentration options are described; the live page contains legacy inconsistencies that must be confirmed by quote |
| Application | Periodic size checks, monitoring and deposition for SSIS workflows |
| Documentation | Certificate with lot-specific calibration and traceability information |
Requirement map
What Applied Physics needs to know
- SSIS manufacturer and model.
- Wafer deposition system or method.
- Required particle size nodes.
- Required concentration option.
- Wafer diameter and substrate.
- Monitoring frequency and target counts.
- Certificate and comparison requirements.
Choose suspension or finished wafer
Two commercial pathways
Calibration wafer standard
Customer needs a delivered wafer artifact with defined deposition pattern, particle nodes and counts.
Applied Physics technical pathway
Match the standard to the measurement—not the other way around.
Send the instrument, medium, target size, concentration, certificate and packaging requirements to Applied Physics for a technical recommendation.